To certainly obtain an intensity change in each pixel to always obtain an excellent phase contrast image.
This radiation imaging system includes an X-ray source 11, first and second absorption type gratings 31, 32, and a flat panel detector (FPD) 30, and obtains the phase contrast image of a test object H by performing imaging while moving the second absorption type grating 32 in an x direction relatively to the first absorption type grating 31. The following expression is satisfied where p1' denotes a period of a first pattern image at a position of the second absorption type grating 32, and p2' denotes a substantial grating pitch of the second absorption type grating 32, and DX denotes a dimension related to the x direction of an X-ray reception area of each pixel of the FPD 30. Here, "n" denotes a positive integer. DX≠n×(p1'×p2')/|p1'-p2'|.
TADA TAKUJI
AGANO TOSHITAKA
TAKAHASHI KENJI
| JP2008545981A | 2008-12-18 | |||
| JP2008224661A | 2008-09-25 | |||
| JP2008200361A | 2008-09-04 | |||
| JP2007215929A | 2007-08-30 | |||
| JP2008545981A | 2008-12-18 | |||
| JP2008224661A | 2008-09-25 | |||
| JP2008200361A | 2008-09-04 | |||
| JP2007215929A | 2007-08-30 |
| WO2007125833A1 | 2007-11-08 | |||
| WO2007125833A1 | 2007-11-08 |
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