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Patent Searching and Data


Title:
RADIATION SPECTRUM MEASURING SYSTEM
Document Type and Number:
Japanese Patent JP2009079969
Kind Code:
A
Abstract:

To provide a radiation spectrum measuring system capable of reducing the influence of a tail distribution in a pulse height distribution formed by an excitation X-ray, and lowering the measurement lower limit of an element to be measured.

A rise time detection module 26 compares a rise time of a pulse signal output from a proportional counter 11 with a preset value set previously. Processing is performed so that a pulse signal having a longer rise time of the pulse signal than the preset value is not taken as data by a pulse height analysis module 23. Consequently, the influence of the tail distribution in the pulse height distribution formed by the excitation X-ray can be reduced, and the measurement lower limit of the element to be measured can be lowered.


Inventors:
HIKITA NORIYUKI
Application Number:
JP2007248655A
Publication Date:
April 16, 2009
Filing Date:
September 26, 2007
Export Citation:
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Assignee:
TOSHIBA CORP
TOSHIBA ELECTRON TUBES & DEVIC
International Classes:
G01T1/18; G01T1/17; H01J47/06
Attorney, Agent or Firm:
樺澤 襄
Satoshi Kabazawa