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Title:
REACTIVE SPUTTERING METHOD UNDER OXIDATION
Document Type and Number:
Japanese Patent JPS59170266
Kind Code:
A
Abstract:

PURPOSE: To increase the rate of formation of a thin film of the oxide of a target substance on a substrate by applying bias potential to the substrate to attract O ions in plasma of a gaseous mixture of an inert gas with gaseous O2 to the substrate.

CONSTITUTION: Bias potential is applied to a substrate 6 on which a thin film of the oxide of the substance of a target 2 is formed from a DC power source 9 for bias to attract O ions generated by gas discharge in an atmosphere of a gaseous mixture of an inert gas with gaseous O2 to the substrate 6. The target substance sputtered from the target 2 bonds to O ions in plasma and deposits on the substrate 6, forming a thin film of the oxide of the target substance. By this method, the rate of film formation is increased.


Inventors:
TAKAGAKI ATSUSUKE
NAKAGAWA YOSHIO
ABE KATSUO
KAMEI TSUNEAKI
Application Number:
JP4412683A
Publication Date:
September 26, 1984
Filing Date:
March 18, 1983
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
C23C14/06; C23C14/00; C23C14/08; G11B5/85; G11B5/851; (IPC1-7): C23C15/00; G11B5/84
Attorney, Agent or Firm:
Akio Takahashi



 
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