Title:
受信装置及び試験システム
Document Type and Number:
Japanese Patent JP7242360
Kind Code:
B2
Abstract:
To provide a receiving device and a test system capable of more easily performing an operation test on a receiving device which forms a receiving beam pattern using the DBF method.SOLUTION: The receiving device of the embodiment includes a plurality of demodulation units, a test signal generation unit, a switch, and a storage unit. The plurality of demodulation units demodulate each of the plurality of received signals. The test signal generation unit generates a test signal obtained by dividing a clock signal indicating a timing at which the demodulator operates, and initializes the phase of the test signal according to an input of a reference signal which synchronizes each of the operations of the plurality of demodulation units. The switch switches whether or not to supply the test signal as a reception signal to the plurality of demodulation units. When the storage unit and the switch supply the test signal to the plurality of demodulation units, the demodulation results output from each of the plurality of demodulation units are stored in synchronization with the clock signal.SELECTED DRAWING: Figure 1
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Inventors:
Yoshinori Kuji
Takahiro Shibata
Masaki Iwasaki
Tomohide Mizuno
Takahiro Shibata
Masaki Iwasaki
Tomohide Mizuno
Application Number:
JP2019049627A
Publication Date:
March 20, 2023
Filing Date:
March 18, 2019
Export Citation:
Assignee:
Toshiba Corporation
Toshiba Infrastructure Systems & Solutions Corporation
Toshiba Infrastructure Systems & Solutions Corporation
International Classes:
G01S7/40; G01S3/46; G01S7/02
Domestic Patent References:
JP3031783A | ||||
JP2009294071A | ||||
JP2018529967A | ||||
JP2019041218A | ||||
JP2018535392A |
Foreign References:
CN106443599A | ||||
WO2012008110A1 |
Attorney, Agent or Firm:
Patent Attorney Shiga International Patent Office
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