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Patent Searching and Data


Title:
樹脂、レジスト組成物及びレジストパターンの製造方法
Document Type and Number:
Japanese Patent JP7406339
Kind Code:
B2
Abstract:
To provide a compound allowing manufacture of a resist pattern with good CD uniformity.SOLUTION: The invention provides a compound of formula (I) and a resist composition. [In the formula, Ris H or a methyl group; Lis an alkanediyl group; Ris H, or a group of the formula (1a) or (2a); R, Rand Rare each an alkyl group; naa is 0 or 1; Rand Rare each H or an alkyl group; Ris an alkyl group; Xis O or S; m3 is 2 or 3; Ris a halogen atom, an OH group, an alkyl group, or the like; and m4 is from 0 to 3.]SELECTED DRAWING: None

Inventors:
Masahiko Shimada
Takahiro Yasue
Koji Ichikawa
Application Number:
JP2019190329A
Publication Date:
December 27, 2023
Filing Date:
October 17, 2019
Export Citation:
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Assignee:
Sumitomo Chemical Co., Ltd.
International Classes:
C08F20/30; C08F220/30; G03F7/004; G03F7/039; G03F7/20
Domestic Patent References:
JP2001503040A
JP2020122083A
JP2007256347A
JP2018016792A
JP2017207532A
JP2013174660A
Foreign References:
US20010051314
Attorney, Agent or Firm:
Patent Attorney Corporation Shinju Global IP