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Title:
RESIN SEALING TYPE SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JPS5790965
Kind Code:
A
Abstract:

PURPOSE: To lower the internal stress of a shape, and to improve wetproof property and corrosion resistance by sealing the semiconductor device with a composition obtained by each compounding quantities within the predetermined ranges of silicon resin, a flexible acid anhydride, an organic Al compound and inorganic fillers to epoxy resin.

CONSTITUTION: The composition manufactured by compounding the following (a)W(e) is used as th thermocuring resin composition sealing an element. (a) 5W 25wt% resin such as a bisphenol A group epoxy resin, epoxy equivalent thereof is 250 or lower and the softening point thereof is 60W110°C. (b) 1W8wt% silicon resin (a curing agent), hydroxyl group equivalent of hydroxyl groups thereof dirctly combining with silicon elements is 100W500 and the softening point thereof is 60W110°C. (c) A 1W8wt% curing agent such as the denatured liquefied acid anhydride. (d) A 0.01W2w% substance such as Al isopropoxide as a reaction accelerator. (e) A 65W82wt% substance such as non-alkaline crystalline silica as the fillers. A fire retardant, a pigment, a release agent, etc. are properly compounded to these materials as necessary. Accordingly, the composition suitable for a low pressure transfer method can be obtained.


Inventors:
YOSHIZUMI AKIRA
AZUMA MICHIYA
KOKUBO ATSUO
SUZUKI SHIYUICHI
Application Number:
JP16588380A
Publication Date:
June 05, 1982
Filing Date:
November 27, 1980
Export Citation:
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Assignee:
TOKYO SHIBAURA ELECTRIC CO
International Classes:
C08G59/00; C08G59/68; C08K5/56; C08L63/00; H01L23/29; H01L23/31; (IPC1-7): C08G59/40; C08G59/42; C08K5/56; C08L63/00



 
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