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Patent Searching and Data


Title:
RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, NOVEL COMPOUND AND ACID GENERATOR
Document Type and Number:
Japanese Patent JP2012022212
Kind Code:
A
Abstract:

To provide a compound suitable as an acid generator for resist composition, an acid generator made from the compound, a resist composition including the acid generator, and a method for forming a resist pattern using the resist composition.

The present invention relates to an acid generator comprising a compound expressed by the general formula (b1), and a resist composition comprises: a base component whose solubility in an alkali developing solution changes by an action of acid; and the acid generator component generating acid by light exposure that is a compound expressed by the formula (b1). In the formula, R1 represents a hydrogen atom, a linear, a branched or a cyclic alkyl group having 1 to 10 carbon atoms or heterocyclic group; R2 represents a linear or a branched alkyl group having 1 to 10 carbon atoms; x represents an integer of 0 to 6; n represents an integer of 0 to 3; and X- represents an anion.


Inventors:
KOMURO YOSHITAKA
UTSUMI YOSHIYUKI
Application Number:
JP2010161090A
Publication Date:
February 02, 2012
Filing Date:
July 15, 2010
Export Citation:
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Assignee:
TOKYO OHKA KOGYO CO LTD
International Classes:
G03F7/004; C07C309/06; C07C309/07; C07C309/09; C07C309/10; C07C309/12; C07C309/17; C07C311/48; C07C311/51; C07D333/16; C09K3/00; G03F7/039; H01L21/027; C07D213/79; C07D327/04
Attorney, Agent or Firm:
Sumio Tanai
Masatake Shiga
Suzuki Mitsuyoshi
Mitsunaga Igarashi