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Patent Searching and Data


Title:
RESIST PATTERN FORMING METHOD
Document Type and Number:
Japanese Patent JPH09160259
Kind Code:
A
Abstract:

To enhance the strength of a resist after development and to avoid the falling of a pattern even in the case of a fine pattern by bringing a resist film into contact with an acidic soln. after exposure and development.

A resist film 2 is formed on a wafer 1 and baked. Paddle development is carried out using a developer 3 to form a resist pattern 4. An aq. sulfuric acid soln. used as an acidic soln. 6 is dropped and the pattern 4 on the wafer 1 is baked with a heater 7. The acidic soln. 6 is washed off by turning the wafer 1 while dropping pure water as a rinse 8 on the wafer 1, the rinse 8 is removed by shaking and the pattern 4 is dried. Since the resist film 2 after development is brought into contact with the acidic soln. 6 to further harden the resist, the falling of the pattern due to the surface tension of the rinse 8 in the drying process can be prevented.


Inventors:
YANO KEIKO
YANO EI
Application Number:
JP31799695A
Publication Date:
June 20, 1997
Filing Date:
December 06, 1995
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G03F7/004; G03F7/32; G03F7/40; H01L21/027; (IPC1-7): G03F7/40; G03F7/004; G03F7/32; H01L21/027
Attorney, Agent or Firm:
Keizo Okamoto