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Patent Searching and Data


Title:
ROTARY PROBE TYPE EDDY FLAW DETECTOR
Document Type and Number:
Japanese Patent JPH1137977
Kind Code:
A
Abstract:

To eliminate the generation of a scratch in a bar-shaped specimen by arranging at least two roller devices at a position before or after a probe in a guide sleeve into which the specimen is inserted to fix a passing core position of the specimen.

Inlet and outlet side guide sleeves 3a and 3b are arranged in contact with an eddy flaw detector 1 to guide an specimen 2 as atomic fuel bar cover tube, for instance, and a probe 4 for scratches is provided therebetween. For example, more than one roller devices 7 which each comprise upper and lower rollers 7a and 7b pivoted on a roller holder having a spring for urging and an adjusting piece for fine positional adjustment are arranged on the guide sleeves 3a and 3b at a position before and after the probe 4 so as to always keep constant the axial position of the object 2 to be inspected along the length thereof. This eliminates slide contact with the internal surfaces of the guide sleeves 3a and 3b and also hold a clearance with the probe 4 constant when the object 2 to be inspected is inserted for eddy detection of flaws.


Inventors:
NUMATA MASARU
SHINTANI MITSUO
Application Number:
JP19700097A
Publication Date:
February 12, 1999
Filing Date:
July 23, 1997
Export Citation:
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Assignee:
NIPPON NUCLEAR FUELS
International Classes:
G01N27/90; B65H57/12; B65H57/14; (IPC1-7): G01N27/90
Other References:
J,BIOTECHNOL=1985
NUCLEIC,ACIDS,RES=1986
Attorney, Agent or Firm:
Kazuo Sato (3 others)