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Title:
SALT, RESIST COMPOSITION AND METHOD FOR MANUFACTURING RESIST PATTERN
Document Type and Number:
Japanese Patent JP2012167083
Kind Code:
A
Abstract:

To provide a salt, an acid generator and a resist composition capable of providing a resist pattern having excellent line edge roughness.

The salt is expressed by formula (I). In the formula, Q1 and Q2 each independently represent a fluorine atom or a perfluoroalkyl group; L1 and L2 each independently represent a divalent saturated hydrocarbon group, in which a methylene group constituting the hydrocarbon group may be substituted with an oxygen atom or the like; Z1 represents a single bond, a methylene group, an ethylene group, a carbonyl group, an oxygen atom or a sulfur atom; R1 represents an alkyl group, in which a methylene group constituting the alkyl group may be substituted with an oxygen atom or the like; s represents an integer of 0 to 2; Y represents an alicyclic hydrocarbon group optionally having a substituent, in which a methylene group constituting the alicyclic hydrocarbon group may be substituted with an oxygen atom, a sulfonyl group or the like; and Z+ represents an organic counter ion.


Inventors:
ADACHI YUKAKO
SHIGEMATSU JUNJI
ICHIKAWA KOJI
Application Number:
JP2012007720A
Publication Date:
September 06, 2012
Filing Date:
January 18, 2012
Export Citation:
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Assignee:
SUMITOMO CHEMICAL CO
International Classes:
C07C309/17; C07C381/12; C07D327/08; C07D493/08; C09K3/00; G03F7/004; G03F7/039; H01L21/027
Attorney, Agent or Firm:
Shinki Global IP Patent Corporation