Title:
検体検査システム、ラック搬送システム、ラック搬送制御装置およびラック搬送方法
Document Type and Number:
Japanese Patent JP7407211
Kind Code:
B2
Abstract:
To provide a specimen inspection system, a rack transportation system, a rack transportation control device, and a rack transportation control method enabling reduction of the work of operators.SOLUTION: A specimen inspection system 1 comprises: a specimen rearrangement device 40 translocating a specimen container held in a first rack to a second rack; a specimen storage device 70 translocating the specimen container which has been processed by a smear preparation device 52 and an analysis device 62, from the second rack to a specimen container storage tool for storage; transportation devices 51 and 61 transporting the second rack among the specimen rearrangement device 40, the smear preparation device 52, the analysis device 62, and the specimen storage device 70; and a transportation control device 80 controlling the transportation devices 51 and 61. The transportation control device 80 controls the transportation of the second rack in both directions between the specimen rearrangement device 40 and the specimen storage device 70.SELECTED DRAWING: Figure 1
Inventors:
Koken Toyama
Yuichiro Ohmae
Toshiki Sato
Hiroyuki Tsuji
Yuichiro Ohmae
Toshiki Sato
Hiroyuki Tsuji
Application Number:
JP2022004695A
Publication Date:
December 28, 2023
Filing Date:
January 14, 2022
Export Citation:
Assignee:
Sysmex Corporation
International Classes:
G01N35/04
Domestic Patent References:
| JP2020128913A | ||||
| JP2009186201A | ||||
| JP2014029275A | ||||
| JP10132828A | ||||
| JP2019138700A1 | ||||
| JP2002357612A |
Foreign References:
| WO2012043261A1 |
Attorney, Agent or Firm:
Masamasa Shibano
Makoto Ohashi
Makoto Ohashi
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