Title:
試料撮影装置
Document Type and Number:
Japanese Patent JP7015227
Kind Code:
B2
Abstract:
Provided is a sample imaging apparatus capable of performing each of imaging using fluorescent light of a sample and imaging using chemiluminescent light of the sample at a high resolution.The sample imaging apparatus includes: an imaging unit that images a sample by using an achromatic lens in which longitudinal chromatic aberration is corrected in a wavelength range of chemiluminescent light of the sample; an excitation light source (the first epi-illumination light source and/or the second epi-illumination light source) that irradiates the sample with excitation light for causing the sample to emit fluorescent light; and an imaging control unit that adjusts a focal length of the achromatic lens in each imaging in a case of imaging the single sample a plurality of times by changing a wavelength range of the fluorescent light emitted by the sample, and performs imaging in a wavelength order of the fluorescent light used for the imaging.
Inventors:
Takuji Tada
Application Number:
JP2018183004A
Publication Date:
February 15, 2022
Filing Date:
September 27, 2018
Export Citation:
Assignee:
FUJIFILM Corporation
International Classes:
G01N21/64; G01N21/78; G02B21/36
Domestic Patent References:
| JP2000241352A | ||||
| JP2008502027A | ||||
| JP2008275408A | ||||
| JP2009523008A | ||||
| JP5297437A | ||||
| JP2010276362A | ||||
| JP2006519995A | ||||
| JP2001091822A | ||||
| JP2007003323A |
Foreign References:
| WO2016013470A1 | ||||
| US20140218589 |
Attorney, Agent or Firm:
Kobayashi International Patent Office