Title:
コンピュータ断層撮影撮像のための散乱補正
Document Type and Number:
Japanese Patent JP7314228
Kind Code:
B2
Abstract:
Systems and methods for scatter correction of computed tomography images for x-ray inspection are provided. In an embodiment, at least one scatter image of an object (208) is corrected using partial scatter-free images acquired using an aperture plate (212). The aperture plate (212) is positioned between the object (208) and a radiation detector (206) and includes apertures (48) in a grid. The original x-rays pass through the apertures (48) and scattered x-rays are blocked by the aperture plate (212). The aperture plate (212) is moved to different positions (211, 213, 214, 215), allowing partial scatter-free images to be acquired at each position (211, 213, 214, 215) of the aperture plate (212). At least one scatter-free image is generated by combining partial scatter-free images. The at least one scatter and the at least one scatter-free images are used to train a scatter correction model.
Inventors:
Nils Rote
Application Number:
JP2021166872A
Publication Date:
July 25, 2023
Filing Date:
October 11, 2021
Export Citation:
Assignee:
Baker Hughes Oilfield Operations, LLC
International Classes:
G01N23/04
Domestic Patent References:
| JP2020146453A | ||||
| JP2020049059A | ||||
| JP57203426A | ||||
| JP60181638A | ||||
| JP2000321221A | ||||
| JP2020527060A | ||||
| JP2010054356A |
Foreign References:
| US20160258885 | ||||
| US20190066268 | ||||
| US20180330233 | ||||
| US20100140485 |
Other References:
大竹 豊,産業用CT応用におけるX線イメージング技術の重要性,2020年度精密工学会春季大会学術講演会講演論文集,2020年03月01日,pp. 606-607,doi:10.11522/pscjspe.2020S.0_606
Attorney, Agent or Firm:
Patent Attorney Corporation Sakamoto International Patent and Trademark Office