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Title:
SCATTERING PARTICLE REMOVING DEVICE, SCATTERING PARTICLE REDUCING METHOD, LIGHT SOURCE APPARATUS, LIGHTING OPTICAL DEVICE, EXPOSURE DEVICE AND MANUFACTURING METHOD OF ELECTRONIC DEVICE
Document Type and Number:
Japanese Patent JP2009070982
Kind Code:
A
Abstract:

To prevent the deterioration of the optical performance of an optical system by efficiently removing scattering particles.

This scattering particle removing device removing scattering particles generated by plasma generation is provided with an electrode plate arranged in an optical path of EUV light radiated from plasma and a voltage applying part which is installed outside the optical path of EUV light and applies a positive voltage or a negative voltage to the electrode plate. The electrode plate is disposed to cross the optical path of EUV light.


Inventors:
AOKI TAKASHI
Application Number:
JP2007236897A
Publication Date:
April 02, 2009
Filing Date:
September 12, 2007
Export Citation:
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Assignee:
NIKON CORP
International Classes:
H01L21/027
Domestic Patent References:
JP2005332923A2005-12-02
JPH10221499A1998-08-21
JP2006287003A2006-10-19
JP2005005666A2005-01-06
JP2003007611A2003-01-10
Attorney, Agent or Firm:
Furuya Fumio
Toshihide Mori