To create an optimal schedule in consideration of a constraint condition in which "for some testing devices, different kinds of components can be set and tested together using the same testing device, the same tool and the same test condition".
Various constraint conditions for creating a schedule are inputted by an input device 1, the schedule is created by a schedule operation section 2, and the schedule is outputted from an output device 3. In the schedule operation section 2, when "a test on an electronic component" selected as an allocatable test requires a worker and a testing device capable of performing batch processing and it is determined that the worker and the testing device capable of performing batch processing are free, a plurality of "tests on electronic components" using the same testing device and the same test condition are grouped and starting/finishing times of "tests on electronic components" for one group selected on the basis of a predetermined group selection criterion are allocated to the schedule.
FUJIWARA NAOYUKI
NAKAYAMA KEITA
MUKAI TAKESHI
NAKAO MASARU
Tadahiro Mitsuishi
Yasuyuki Tanaka
Hiroshi Matsumoto