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Title:
SEMICONDUCTOR DEVICE INSPECTION METHOD, AND SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP2010067665
Kind Code:
A
Abstract:

To provide a semiconductor device inspection method for highly reliably managing rewriting times in a test process concerning each semiconductor device, and to provide the semiconductor device.

The method inspects an IC chip having a memory circuit 23 which rewrites data, and includes: a process for preparing a main storage area 31 used by a user and a storage area 33 for a test in the memory circuit 23, and performing a data rewriting test with respect to the main storage area 31; and a process for recording times of the actually performed data rewriting with respect to the main storage area 31 in the process for performing the rewriting test in the storage area 33 for the test. By the method, times of the data rewriting actually performed in the test process before delivery are correctly managed concerning each IC chip.


Inventors:
OKUHARA AKISHI
Application Number:
JP2008230613A
Publication Date:
March 25, 2010
Filing Date:
September 09, 2008
Export Citation:
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Assignee:
SEIKO EPSON CORP
International Classes:
H01L21/66; G11C16/02; G11C29/04; H01L21/822; H01L27/04
Domestic Patent References:
JP2007042155A2007-02-15
JP2002133887A2002-05-10
JP2007058974A2007-03-08
Attorney, Agent or Firm:
Masahiko Ueyanagi
Osamu Suzawa
Kazuhiko Miyasaka



 
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