SEMICONDUCTOR DEVICE, PRODUCTION DEVICE THEREFOR AND INSPECTION DEVICE THEREFOR

Title:

SEMICONDUCTOR DEVICE, PRODUCTION DEVICE THEREFOR AND INSPECTION DEVICE THEREFOR

Document Type and Number:

Japanese Patent JP2004342832

Kind Code:

A

Abstract:

To provide a semiconductor device in which each element is formed on each surface of a semiconductor base material having a number of the surfaces and circuits on each surface are connected electrically, a production device for the semiconductor device in which each element is formed on a number of the surfaces, and an inspection device for the semiconductor device.

The semiconductor device has the tabular semiconductor base material 11 and each element 2 and 3 formed on the two main surfaces of the surface and the rear of the base material 1, and has a connecting means for electrically connecting each element 2 and 4 on the main surface on the surface side and each element 2 and 4 on the main surface on the rear side on the outsides of the end faces of the base material 1. The connecting means preferably contains wires 5 for wiring.

Inventors:

MORIMOTO KIYOSHI

Application Number:

JP2003137400A

Publication Date:

December 02, 2004

Filing Date:

May 15, 2003

Export Citation:

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Assignee:

RENESAS TECH CORP

International Classes:

H01L21/02; H01L21/3205; H01L21/60; H01L23/52; G01R31/28; (IPC1-7): H01L21/02; G01R31/28; H01L21/3205; H01L21/60

Attorney, Agent or Firm:

Kuro Fukami
Toshio Morita
Yoshihei Nakamura
Yutaka Horii
Hisato Noda
Masayuki Sakai

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