Title:
SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP2015149731
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of detecting abnormality which has the potential to cause malfunction in signal transfer via an insulating element to output a stop signal to a control target.SOLUTION: The semiconductor integrated circuit according to the present embodiment comprises: a transmission circuit Tx1 for creating and outputting a transmission signal corresponding to transmission data VIN supplied from the outside; a receiving circuit Rx1 for regenerating the transmission data VIN on the basis of a received signal; an insulating element ISO1 for insulating the transmission circuit Tx1 and the receiving circuit Rx1 and transferring the transmission signal as the received signal; an abnormality detection part DT1 for detecting abnormality which has the potential to cause malfunction in signal transfer via the insulating element ISO1; and a control part CT1 fro outputting a stop signal regardless of the transmission data VIN supplied from the outside to the transmission circuit Tx1 when malfunction is detected by the abnormality detection part DT1.
Inventors:
KAERIYAMA JUNICHI
Application Number:
JP2015048284A
Publication Date:
August 20, 2015
Filing Date:
March 11, 2015
Export Citation:
Assignee:
RENESAS ELECTRONICS CORP
International Classes:
H04L25/02; H01F19/04; H03K5/08; H03K17/08; H03K17/28; H03K17/687
Domestic Patent References:
| JP2010010762A | 2010-01-14 | |||
| JP2012080156A | 2012-04-19 | |||
| JP2000115259A | 2000-04-21 | |||
| JP2010213246A | 2010-09-24 | |||
| JPS61238143A | 1986-10-23 | |||
| JP2001238432A | 2001-08-31 |
Foreign References:
| WO2010113383A1 | 2010-10-07 |
Attorney, Agent or Firm:
Ken Ieiri