Title:
半導体装置
Document Type and Number:
Japanese Patent JP4440214
Kind Code:
B2
Abstract:
A semiconductor device of the present invention includes a comparator (1) which includes two input terminals (N1), (N2), and compares the voltage values between the power supply voltage which is inputted to one side input terminal and the reference voltage which is inputted to the other side input terminal, a resister element (2) which connects the signal line (L1) which is connected the input terminal (N1) of the comparator (1) and the signal line (L2) which is the input terminal (N2) of the comparator (1), and a capacitance element (3) one end of which is connected to a power supply terminal for applying a power supply and the other end of which is connected to one input terminal of the comparator (2). Thereby, a step variation of a power supply voltage can be detected without depending on the power supply voltage before the voltage variation.
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Inventors:
Regular Eiichi
Jun Horikawa
Jun Horikawa
Application Number:
JP2005516803A
Publication Date:
March 24, 2010
Filing Date:
November 10, 2004
Export Citation:
Assignee:
Panasonic Corporation
International Classes:
G05F1/10; G05F1/575
Domestic Patent References:
| JP3005634B2 | ||||
| JP51039433U |
Foreign References:
| US20030080812 |
Attorney, Agent or Firm:
Kenichi Hayase