To provide a self-test circuit technology in which a circuit to be tested is tested fro dynamic failure through a relatively simple constitution and a propagation delay time is made constant.

A test signal is applied from an input signal generation circuit 1 to a circuit 3 to be tested and a test results output signal is latched by a latch circuit 8 in response to a strobe input signal (strobe signal). The strobe signal has period T identical to that of a clock signal being fed to a sync clock input signal terminal and controls the phase difference tθ. Consequently, the strobe position is varied and an output signal sequence from the latch circuit 8 is compressed by an output signal compression circuit 5 in synchronism with a clock signal. Subsequently, the compressed signal is compared by a comparator 7 with an expected value signal from an output signal expected value generation circuit 6 and it is judged whether the circuit 3 to be tested is dynamically good or bed through a judged value output signal terminal.