Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
半導体装置、表示装置及びそれらの製造方法
Document Type and Number:
Japanese Patent JP5172250
Kind Code:
B2
More Like This:
JPS54105463SEMICONDUCTOR
JP2000040679MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
JP4681356Defect automatic observation classification system, device selection method, program, and observation device in defect automatic observation classification system
Inventors:
High Yu Fuji
Yasumori Fukushima
Takehiro Tomiyasu
Michiko Takei
Application Number:
JP2007229306A
Publication Date:
March 27, 2013
Filing Date:
September 04, 2007
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
Sharp Corporation
International Classes:
H01L21/02; G09F9/30; H01L21/3205; H01L21/336; H01L21/768; H01L23/522; H01L27/12; H01L29/786
Domestic Patent References:
JP2003022033A
JP2004228373A
JP2004319538A
JP2006210900A
Attorney, Agent or Firm:
Atomi International Patent Office
Yasuo Yasutomi
Takanori Tamai
Kazunobu Shigehira



 
Previous Patent: 複合金属触媒

Next Patent: SEAL DEVICE