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Title:
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND OSCILLATION FREQUENCY CALIBRATION METHOD
Document Type and Number:
Japanese Patent JP2011155489
Kind Code:
A
Abstract:

To provide a semiconductor integrated circuit device and an oscillation frequency calibration method which can reduce calibration operations of the oscillation frequency of an oscillator.

The semiconductor integrated circuit device includes a DCO 50 and a storage part 42 that stores a temperature coefficient of an oscillation frequency and an absolute value of the oscillation frequency, which should be set in the DCO 50, corresponding to potential obtained from a voltage source 20 that changes with a monotonic characteristic with respect to temperature.


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Inventors:
SATO YUJI
HAMADA MOTOTSUGU
MIYASHITA DAISUKE
Application Number:
JP2010015676A
Publication Date:
August 11, 2011
Filing Date:
January 27, 2010
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
H03B5/04; H03B1/00; H03B5/08; H03B5/12
Domestic Patent References:
JP2002198736A2002-07-12
Attorney, Agent or Firm:
Hiroaki Sakai



 
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