To provide a semiconductor integrated circuit test device and a method which can obtain a test result of a memory to be tested, having automatic operating functions of a flash memory or the like for sorting each test item.

The device is a semiconductor integrated circuit test device for performing a text of a memory 20 to be tested in which automatic operating functions for performing a plurality of times of change operation for changing stored contents inside are provided. The device is provided with a memory 15 furnished with a plurality of storage regions in which test results for the automatic operating functions of the memory 20 to be tested are stored, and a storage region for storing a test result is switched in accordance with a test item of a test for the automatic operating functions of the memory 20 to be tested.