Title:
波形測定用半導体集積回路
Document Type and Number:
Japanese Patent JP3994713
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a measuring circuit capable of highly accurately measuring a high speed, feeble, and wide range voltage waveform on an LSI by a simple measuring method. SOLUTION: This waveform measuring semiconductor integrated circuit 14 is composed of a sampling head 12 for holding a voltage value by referring to the voltage value of an input waveform 1 by a sampling clock signal 4, an amplifier 13 for amplifying and outputting the voltage value held by this sampling head 12, and a sampling clock generating block 11 for supplying the sampling clock signal 4 to the sampling head 12 by generating the sampling clock signal 4 finely different in a period from a clock signal 3 supplied to a measuring object semiconductor integrated circuit 10. Thus, the high speed, feeble, and wide range voltage waveform on the LSI can be highly accurately measured by a simple measuring method.
Inventors:
Takamiya Makoto
Application Number:
JP2001307687A
Publication Date:
October 24, 2007
Filing Date:
October 03, 2001
Export Citation:
Assignee:
NEC
International Classes:
G01R31/28; G01R31/316; G01R31/319; H01L21/82; H01L21/822; H01L27/04; H03K17/00
Domestic Patent References:
| JP2001147256A | ||||
| JP2001142733A |
Attorney, Agent or Firm:
Takao Maruyama