PURPOSE: To shorten a term of manufacture of a test jig and reduce a cost by obtaining multivalued input signals synchronized with reference clocks by two pins having function feature of a tester.

CONSTITUTION: Of two input pins having function feature, a reference clock input pin 26 admits a reference clock of shift registers 21, while a data input to the shift registers 21 is connected to a data input pin 25. Input data to the shift registers 21 turns ON a specific switch of switches 24 via a latch 22 and decoders 23, so that potential of a power source 33 connected to them is transmitted to an IC pin to be measured.