PURPOSE: To form an insulating layer having excellent flattening capacity without crack by using polyhydrogen siloxane synthesized from hydrogen silane having acetoxy group as the material of an interlayer insulating film.
CONSTITUTION: Hydrolysis and polycondensation are conducted at silane compound having 1 to 3 hydrogen groups and 1 to 3 acetoxy groups for one silicon atom, polyhydrogen siloxane represented by a formula is synthesized, which is diluted by solvent to solution. A semiconductor substrate is coated with the solution to form a coating film, then thermally decomposed in an oxidizing atmosphere to form a silica insulating film. Thus, the Si-H bond of the siloxane is replaced with the Si-O bond, and an expansion stress is generated, and hence no crack occurs.
JPH1092808 | MANUFACTURE OF SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE |
JPH10242276 | MANUFACTURE OF SEMICONDUCTOR DEVICE |
JP2679647 | SEMICONDUCTOR DEVICE |
FUKUYAMA SHUNICHI
KOBAYASHI TOMOKO
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