PURPOSE: To increase simulation speed by accumulating a test signal in an event memory in the case of a chip executing a static operation and outputting a selective signal so that the same test signals are not read out repeatedly.

CONSTITUTION: The event memory 5 accumulates the test signals in the memory by the selective signal from a memory controller 1 and outputs the test signal in the memory or outputs the test signals without accumulating them in the memory. The test signal from the event memory 5 is inputted to a real chip packaged on a chip packaging substrate 6, and an output signal from the real chip is inputted to a simulation part 7. It simulates a circuit part consisting of a software model except for a real chip part by the test signal from a test signal generation circuit 4 and the output signal from the real chip.