SIMULTANEOUS MULTI-CONTACT PROBE

Title:

SIMULTANEOUS MULTI-CONTACT PROBE

Document Type and Number:

Japanese Patent JPS5487070

Kind Code:

A

Abstract:

PURPOSE: To secure the simultaneous probing for all terminals of one element on the circuit substrate.

CONSTITUTION: The probe consists of insulator 2 containing the guide groove, connecting circuit 3 which contains wiring patter 10 and adhered on insulator 2, and the metal spring containing the contact part at its tip. The metal spring is located within the guide groove. In addition, the following units are installed: probe plate 6 which contains plural units of probing block 5 adhered with the rear end of the metal spring fixed to pattern 10; and connecting plate 7 containing plural units of connecting block 8 in which spring contact pin 9 containing contact part at its tip pierced vertically to the plate surface (The connecting plate can be formed by burying pin 9 directly in the necessary number). The electric connection is secured between plate 6 and 7 through the contact between pattern 10 and pin 9.

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Inventors:

SONODA MASAO
SHIBAYAMA TAKESHI
OKADA NOBUHIDE

Application Number:

JP15478377A

Publication Date:

July 11, 1979

Filing Date:

December 22, 1977

Export Citation:

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Assignee:

FUJITSU LTD

International Classes:

G01R1/073; H01L21/66; G01R31/26; (IPC1-7): G01R31/26; H01L21/66

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