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Title:
小型試験装置
Document Type and Number:
Japanese Patent JP4617008
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a small-sized testing device having a high pseudo-adiabatic effect. SOLUTION: This small-sized testing device is operated as follows: a heater 13a is driven so that temperature of a main body 13b detected by a second thermometer 50 is made to be equal to a result measured by a first thermometer 30 while temperature of a composting space CS is measured by the first thermometer 30; then the temperature of the composting space CS is made to be approximately equal to the temperature of the main body 13b; further flowing-in/out of the heat between the composing space CS and an outer vessel 13 is not occurred; and finally such a pseudo-adiabatic effect that a reaction vessel 11 is thermally isolated from the surroundings is realized. At this time, it is prevented that the reaction vessel 11 is strongly affected by the surrounding temperature, because an air layer AR acts as a buffer. Namely, excessive flowing-in/out of the heat caused by overshooting and control delay of the heater 13a is appropriately controlled with a suitable time-lag. Therefore, thermal stability of the reaction vessel 11 is increased, and an accuracy of the pseudo-adiabatic effect is more enhanced than ever.

Inventors:
Makoto Doi
Masaki Ban
Shiiba research
Noriko Komine
Toshinori Kimura
Application Number:
JP2001053336A
Publication Date:
January 19, 2011
Filing Date:
February 28, 2001
Export Citation:
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Assignee:
Nisshin Flour Milling Group Inc.
International Classes:
C12M1/00; B09B3/00; C05F3/06; C05F11/06; C05F17/02; C12M1/38
Domestic Patent References:
JP61131800U
JP62064298U
JP54107597A
JP2000254625A
Attorney, Agent or Firm:
Junji Yuda
Chika Takagi
Kosuke Nishimura
Yoshihiro Fujimoto



 
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