PURPOSE: To enable the simultaneous terminal dimension inspection and electrical characteristic measurement of a measured material bv providing a go gauge allowing the passing of a terminal of a specified dimension of a semiconductor part and a not-go gauge preventing the passing of a terminal beyond the specified dimension.

CONSTITUTION: A go gauge 2 and a not-go gauge 4 are provided on the passing-in side and the passing-out side of a pin hole 3a in a socket 3. The gauge 2 is provided with a gauge port 2a having an aperture allowing the passing of a terminal 1a of a specified dimension of a semiconductor part 1, and the not-go gauge 4 is provided with a gauge port 4a having an aperture preventing the passing of the terminal 1a beyond the specified dimension, and the gauge ports 2a, 4a are formed so as to coincide with the pin hole 3a of the socket 3. Thus, the terminal 1a within the specified dimension of the semiconductor part 1 is passed through the gauge port 2a of the go gauge 2, inserted into the pin port 3a of the socket a for electrical continuity, and stopped by the not-go gauge 4, so that it can not be inserted beyond that. Hence, the terminal dimension inspection and electric characteristic measurement of a measured material can be conducted simultaneously.