Title:
SPECIMEN MEASURING APPARATUS
Document Type and Number:
Japanese Patent JP2008292159
Kind Code:
A
Abstract:
To provide a specimen measuring apparatus capable of facilitating the grasping of a maintenance work schedule of a specimen analyzing device.
The specimen measuring apparatus (an immunoassay device 1) is provided with a measuring part (a measuring device 2) for measuring specimens, a storage part (a hard disk) for storing maintenance schedules, a display part 4b, and a display control part (a control part 4a) for displaying a display screen in a calendar form on the display part 4b to be displayed in relation to a date and maintenance items scheduled to execute on the date.
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Inventors:
TAKEHARA HISATO
WAKAMIYA YUJI
OKUZAKI TOMOHIRO
WAKAMIYA YUJI
OKUZAKI TOMOHIRO
Application Number:
JP2007123999A
Publication Date:
December 04, 2008
Filing Date:
May 08, 2007
Export Citation:
Assignee:
SYSMEX CORP
International Classes:
G01N35/00
Domestic Patent References:
JPH06160397A | 1994-06-07 | |||
JP2005037159A | 2005-02-10 | |||
JPH05158885A | 1993-06-25 | |||
JPH08249287A | 1996-09-27 | |||
JPH03118131A | 1991-05-20 | |||
JP2005323047A | 2005-11-17 | |||
JPH09211003A | 1997-08-15 | |||
JPH08338847A | 1996-12-24 |
Foreign References:
US6611275B1 | 2003-08-26 |
Attorney, Agent or Firm:
Takuji Nishino
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