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Title:
SPECIMEN MEASURING APPARATUS
Document Type and Number:
Japanese Patent JP2008292159
Kind Code:
A
Abstract:

To provide a specimen measuring apparatus capable of facilitating the grasping of a maintenance work schedule of a specimen analyzing device.

The specimen measuring apparatus (an immunoassay device 1) is provided with a measuring part (a measuring device 2) for measuring specimens, a storage part (a hard disk) for storing maintenance schedules, a display part 4b, and a display control part (a control part 4a) for displaying a display screen in a calendar form on the display part 4b to be displayed in relation to a date and maintenance items scheduled to execute on the date.


Inventors:
TAKEHARA HISATO
WAKAMIYA YUJI
OKUZAKI TOMOHIRO
Application Number:
JP2007123999A
Publication Date:
December 04, 2008
Filing Date:
May 08, 2007
Export Citation:
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Assignee:
SYSMEX CORP
International Classes:
G01N35/00
Domestic Patent References:
JPH06160397A1994-06-07
JP2005037159A2005-02-10
JPH05158885A1993-06-25
JPH08249287A1996-09-27
JPH03118131A1991-05-20
JP2005323047A2005-11-17
JPH09211003A1997-08-15
JPH08338847A1996-12-24
Foreign References:
US6611275B12003-08-26
Attorney, Agent or Firm:
Takuji Nishino