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Patent Searching and Data


Title:
SPECIMEN MOVING DEVICE FOR ELECTRON MICROSCOPE
Document Type and Number:
Japanese Patent JPH06111746
Kind Code:
A
Abstract:

PURPOSE: To prevent the target point for observation on a specimen from dislocation off from the axis of an electron beam even though the shaft of a specimen holder is rotated, by mounting conical supporting rollers in the retention part which retains the specimen holder slidably in the axial direction.

CONSTITUTION: A specimen holder 3 under the retention surface for it of a retaining cylinder 4 is supported by a supporting part S slidably along the axis A, and the part S is fitted with conical supporting rollers 15 in positions symmetrical to the left and right under the retention surface. These supporting rollers 15 are arranged in the part S so that the cylindrical surface 16 of each supporting roller 15 contacts the outside surface of the holder 3 wherein the contacting point lies at the point 120deg. turned from vertical up the retaining cylinder 4. A pressure roller 11 supported by a bearing member 12 presses the holder 3 downward vertically from above with the aid of a spring mounted on the cylinder 4, and thereby the holder 3 is retained in a constant position. Even in the case the cylinder 4 and holder 3 are inclined, play in the target specimen position with the axis of electron beam is removed to lead to suppressing runoff of the image to possible minimum.


Inventors:
MIYAZAKI SHINSUKE
Application Number:
JP8925891A
Publication Date:
April 22, 1994
Filing Date:
March 29, 1991
Export Citation:
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Assignee:
TOPCON CORP
International Classes:
H01J37/20; (IPC1-7): H01J37/20
Attorney, Agent or Firm:
Tsuchihashi Aoi