Title:
SPECTRAL PHOTOMETER
Document Type and Number:
Japanese Patent JPH05113369
Kind Code:
A
Abstract:
PURPOSE:To achieve a wavelength original point confirmation operation while an arbitrary object is left in a sample chamber by providing a peak-detection circuit for monitoring fluctuation of a light source. CONSTITUTION:Light which impinges on an incidence slit 1 forms a spectrum image of the incidence light on the surface where an irradiation slit 3 is placed through a diffraction grating 2. Light which outgoes from the irradiation slit 3 to a sample chamber 6 is focused on a light-reception element 8 and is detected. A beam splitter 9 is inserted at the center of a flux of light which is directed toward the irradiation slit 3 from the diffraction grating 2 and impinges on a photodetector 10 where part of the flux of light which is emitted through the irradiation slit 3 to the sample chamber 6 is reflected, thus constituting a peak-detection circuit. A control circuit 11 counts the number of pulse motor drive pulses from a wavelength original point position of the diffraction grating 2 and converts it to a wavelength value of an irradiation slit irradiation light of a spectral meter for obtaining wavelength data on measurement. Also, the output of the light-reception element 9 which receives sample light is taken in through an amplification circuit 13 as spectral data.
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Inventors:
FUKUMA TOSHIAKI
Application Number:
JP30252491A
Publication Date:
May 07, 1993
Filing Date:
October 21, 1991
Export Citation:
Assignee:
SHIMADZU CORP
International Classes:
G01J3/06; G01J3/10; G01N21/27; (IPC1-7): G01J3/06; G01J3/10; G01N21/27
Attorney, Agent or Firm:
Kosuke Agata