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Title:
SPECTROPHOTOMETER
Document Type and Number:
Japanese Patent JP2003232681
Kind Code:
A
Abstract:

To improve accuracy of spectral measurement when moving a wave length at a high speed in a two-light flux spectrophotometer provided with two detectors.

Before measuring a sample, an impression voltage value to the reference light flux side detector and an impression voltage value to the sample light flux side detector are individually held by performing voltage value storage measurement on respective ones of a light detector arranged on the reference light flux side and a light detector arranged on the sample light flux side. When measuring the sample, the holding reference light flux side voltage value and the sample light flux side voltage value are read out, and are respectively impressed on the reference light flux side light detector and the sample light flux side light detector to properly maintain sensitivity of a detecting system.


Inventors:
SAEKI TAKUYA
KABUKI KOHEI
EHATA YOSHISADA
Application Number:
JP2002030557A
Publication Date:
August 22, 2003
Filing Date:
February 07, 2002
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP
International Classes:
G01J3/02; G01J3/42; G01N21/27; G01N21/33; (IPC1-7): G01J3/02; G01J3/42; G01N21/27; G01N21/33
Domestic Patent References:
JPS52106185U1977-08-12
JPS6070319A1985-04-22
JPS58103625A1983-06-20
JPH03120428A1991-05-22
JP2002139380A2002-05-17
JPH06323910A1994-11-25
JPH02236412A1990-09-19
JPH09269266A1997-10-14
Attorney, Agent or Firm:
Yukihiko Takada



 
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