STRAIN MEASUREMENT DEVICE AND STRAIN MEASUREMENT METHOD

Title:

STRAIN MEASUREMENT DEVICE AND STRAIN MEASUREMENT METHOD

Document Type and Number:

Japanese Patent JP2017156210

Kind Code:

A

Abstract:

PROBLEM TO BE SOLVED: To provide a strain measurement device for measuring a distance of displacement of a measured body on the basis of capacitance of a capacitor which is formed by a first electrode and a second electrode.SOLUTION: In a strain measurement device, a first electrode has a tabular shape, and a facing surface of a second electrode, which faces the first electrode, is a curved surface whose distance from the first electrode becomes continuously longer from the center toward an outer periphery of the first electrode.SELECTED DRAWING: Figure 1

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Inventors:

TANAKA MAKOTO

Application Number:

JP2016039283A

Publication Date:

September 07, 2017

Filing Date:

March 01, 2016

Export Citation:

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Assignee:

CHUGOKU ELECTRIC POWER CO INC

International Classes:

G01B7/00; G01B7/16; G01B7/14

Attorney, Agent or Firm:

Isshiki International Patent Service Corporation

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