STRAIN MEASUREMENT METHOD AND STRAIN MEASURING APPARATUS

Japanese Patent JP2008039530

A

To provide a strain measurement method and a strain measuring apparatus, capable of not only measuring the strain generated in a minute region of a specimen, but also measuring both the strain in the planar direction of the surface of the specimen and the stain in the thickness direction of the specimen.

The strain measurement method and the stain measuring apparatus for measuring the stain generated in the specimen by using a polygonal pyramid-shaped dimple formed on the specimen comprise a dimple-shape measuring means which measures respective shapes of the dimple before and after the stain arises in the specimen; and an arithmetic means which calculates the strain from the amount of the shape change in the dimple measured by the dimple-shape measuring means. The dimple-shape measuring means measures the position of a vertex of the polygonal pyramid faces of the polygonal pyramid-shaped dimple, and the arithmetic means calculates the stain from the amount of change in the position of the vertex.

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UCHIDA MAKOTO
TADA NAOYA
SHIMIZU ICHIRO

JP2006212662A

February 21, 2008

August 03, 2006

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UNIV OKAYAMA

G01B21/32

JPS51140656A	1976-12-03
JPH0518899A	1993-01-26
JPS63241405A	1988-10-06
JPH06235618A	1994-08-23
JP2003207432A	2003-07-25

Kenichiro Matsuo

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