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Title:
STRESS MEASURING APPARATUS X-RAY
Document Type and Number:
Japanese Patent JPS533884
Kind Code:
A
Abstract:

PURPOSE: To carry out measurement of stress easily with simple constitution, by moving detector, whose angular position is controlled with intensity of diffracted X-ray, along circle centered at point of incidence of X ray to specimen.


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Inventors:
UEHARA KATSUKAGE
OGISO KATSUHIKO
KAWASAKI TSUTOMU
Application Number:
JP7702476A
Publication Date:
January 13, 1978
Filing Date:
July 01, 1976
Export Citation:
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Assignee:
MITSUBISHI HEAVY IND LTD
RIGAKU DENKI CO LTD
International Classes:
G01L1/00; G01N23/207; (IPC1-7): G01N23/207
Domestic Patent References:
JPS3318782Y1
Foreign References:
US3051834A1962-08-28



 
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