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Patent Searching and Data


Title:
STRIAE INSPECTION APPARATUS FOR OPTICAL PART
Document Type and Number:
Japanese Patent JP2003227775
Kind Code:
A
Abstract:

To provide a method that can easily inspect a striae without using a liquid with an index of refraction close to that of a member, in which the conventional striae inspection immerses the member to inspect with transmission light without the influence of the curvature of the surface of the member.

Parallel optical flux from a Zygo interferometer is divided into with a half-mirror, and one of the flux is entered into an afocal system formed with a collimator and reference lens, and reflected with a total reflection mirror at the back of the system to be returned to a same optical path. The other flux is entered into an afocal system formed with a collimator and a lens to be inspected, and reflected with a total reflection mirror to be interfered with the flux of the reference lens. In these processes, the phase state of an interference fringe is observed with using double-fetching and the repair functions of the Zygo interferometer.


Inventors:
KUWAYAMA TAKESHI
Application Number:
JP2002025525A
Publication Date:
August 15, 2003
Filing Date:
February 01, 2002
Export Citation:
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Assignee:
CANON KK
International Classes:
G01N21/958; G01M11/00; (IPC1-7): G01M11/00; G01N21/958
Attorney, Agent or Firm:
Keizo Nishiyama (1 person outside)