Title:
構造物スキャニング装置および構造物スキャニング方法
Document Type and Number:
Japanese Patent JP6685677
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To efficiently fluoroscope an interior of a target structure over a wide range in a simplified manner.SOLUTION: A structure scanning apparatus 100 according to an embodiment comprises: a first muon detector 11 including a first muon track detector 11a and a first clock 11b; a second muon detector 12 including a second muon track detector 12a and a second clock 12b; a time synchronization unit 21 for synchronization between the first clock 11b and the second clock 12b; and a muon track analysis unit 22 for deriving a track of a muon which has passed through the first muon track detector 11a, a structure, and the second muon track detector 12a. The time synchronization unit 21 includes: a starting point identification unit for identifying a starting point of the synchronization between the first clock 11b and the second clock 12b; a correspondency determination unit for comparing the time at which the muon has passed through the first clock 11b with the time at which the muon has passed through the second clock 12b to determine the correspondency between the times; and a time correction unit for correcting the time for synchronization when a correspondence is determined to be present.SELECTED DRAWING: Figure 1
Inventors:
Sugita
Haruo Miyadera
Kenichi Yoshioka
Haruo Miyadera
Kenichi Yoshioka
Application Number:
JP2015177422A
Publication Date:
April 22, 2020
Filing Date:
September 09, 2015
Export Citation:
Assignee:
Toshiba Corporation
Toshiba Energy Systems Co., Ltd.
Toshiba Energy Systems Co., Ltd.
International Classes:
G01B15/04; G01N23/201
Domestic Patent References:
| JP2013213748A | ||||
| JP2013217811A |
Attorney, Agent or Firm:
Patent Business Corporation Sakura International Patent Office