SUBSTRATE FOR ELECTROOPTICAL DEVICE AND ITS INSPECTING METHOD, ELECTROOPTICAL DEVICE, AND ELECTRONIC EQUIPMENT

Title:

SUBSTRATE FOR ELECTROOPTICAL DEVICE AND ITS INSPECTING METHOD, ELECTROOPTICAL DEVICE, AND ELECTRONIC EQUIPMENT

Document Type and Number:

Japanese Patent JP2006201738

Kind Code:

A

Abstract:

To achieve inspection wherein sufficient measurement precision can be obtained without the need for contact with a probe from outside.

The electrooptical device is equipped with a plurality of scan lines and a plurality of signal lines which cross each other, and an amplifier which has a 1st terminal connected to the signal lines and inputting a 1st potential signal and a 2nd terminal inputting a 2nd potential signal as a reference potential and compares the potentials of the 1st potential signal and 2nd potential signal with each other and outputs the potential of the 1st terminal after making the potential lower when the 1st potential signal is lower and higher when higher, and is connected to at least one of the 1st and 2nd terminals, a selecting means of selecting one of the plurality of signal lines, and a connecting means of electrically connecting the selected signal line to at least one of the 1st and 2nd terminals of the amplifier.

Inventors:

ISHII TATSUYA

Application Number:

JP2005134989A

Publication Date:

August 03, 2006

Filing Date:

May 06, 2005

Export Citation:

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Assignee:

SEIKO EPSON CORP

International Classes:

G09F9/00; G01R31/00; G02F1/13; G02F1/1368; G09F9/30; G09G3/20; G09G3/36

Attorney, Agent or Firm:

Masahiko Ueyanagi
Fujitsuna Hideyoshi
Osamu Suzawa

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