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Patent Searching and Data


Title:
SURFACE INSPECTION DEVICE
Document Type and Number:
Japanese Patent JPS5782713
Kind Code:
A
Abstract:

PURPOSE: To improve the reliability of a device by deciding a defective accurately by storing a defective signal obtained by discriminating an inspection signal obtained by optically scanning the overall width of a material to be inspected, and by displaying and recording a still picture in the center of a monitoring device.

CONSTITUTION: The overall width of a material to be inspected is scanned optically and output signals of photodetectors 4 and 4a are inputted to a discrminating circuit 10 through a preamplifier 7, a main amplifier 8 and a signal processing circuit 9 to discriminate and store a defective signal. On receiving a synchronizing pulse outputted by a pulse generator 23 each time one line is scanned, a control circuit 24 writes the signal from the amplifier in a frame memory 25 through a switch circuit 21 and an ADC22. At the same time, a signal from the circuit 10 is sent to a control circuit to perform address movement processing. After the processing, the contents of the memory 25 are passed through a DAC28 to be monitored 26 as a still picture so that a defective picture is in the center, and defective data from the discriminating circuit 10 is recorded 31 through a gate circuit 30. Thus, the defective is decided accurately and the reliability of the device is improved.


Inventors:
MORIOKA YOSHIHISA
SHIMADA MASAYOSHI
Application Number:
JP15925580A
Publication Date:
May 24, 1982
Filing Date:
November 12, 1980
Export Citation:
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Assignee:
TOKYO SHIBAURA ELECTRIC CO
International Classes:
G01D7/00; G01B21/20; G01B21/30; G01N21/89; G01N21/892; G08C25/00; (IPC1-7): G01B21/30; G01D7/00; G01N21/88; G08C19/00