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Title:
SYSTEM FOR ANALYZING AND MEASURING MATRIX FOR PHOTOFIBER
Document Type and Number:
Japanese Patent JPS564030
Kind Code:
A
Abstract:

PURPOSE: To analyze nondestructively a matrix by arranging a structure with slits at the transmission side of X-rays of the matrix for photofibers, moving the matrix relatively to the slit and detecting only X-rays transmitted through the matrix and the slits.

CONSTITUTION: The inspection device comprises an X-ray source 2 accommodated in a machine box made of lead or the like, a sample loading bedplate 7 movable in the radial direction of a photofiber matrix 10 and made of a material transmitting X-rays, a slit structure 8 made of a metal, an X-ray detector 3, an amplifier 4, and a recorder 5 such as a pen recorder or the like. The photofiber matrix 10 is constituted by a core glass layer 11 containing Ge for adjusting the refractive index and a cladding glass layer 12 containing no Ge. Since Ge has a large absorption coefficient especially to X-rays as compared with these glass main components, the variation of the transmission quantity of X-rays is displayed in the recorder 5 while moving the matrix in the horizontal direction shown by arrow, whereby the analysis of the matrix can be performed nondestructively.


Inventors:
INAGAKI NOBUO
TAKADA HISAO
TAKAHASHI HIROSHI
SHIBUYA TERUJI
Application Number:
JP3203479A
Publication Date:
January 16, 1981
Filing Date:
March 19, 1979
Export Citation:
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Assignee:
NIPPON TELEGRAPH & TELEPHONE
FURUKAWA ELECTRIC CO LTD
International Classes:
G01M11/00; (IPC1-7): G01M11/02
Foreign References:
GB1384245A1975-02-19



 
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