Title:
システム及び検査方法
Document Type and Number:
Japanese Patent JP7379622
Kind Code:
B2
Abstract:
A system includes a first device with a primary screening area; a second device with a secondary screening area different from the primary screening area; and processor circuitry. The first device includes a first antenna and a first communication device; the second device includes a second antenna and a second communication device. The first antenna irradiates an electromagnetic wave to a target in the primary screening area and receives an electromagnetic wave reflected by the target; the second antenna irradiates an electromagnetic wave to the target in the secondary screening area and receives an electromagnetic wave reflected by the target; and the processor circuitry determines a possibility that the target possesses a predetermined article, based on a level of the electromagnetic wave received by the first antenna, and determines that screening by the second device is required for the target in accordance with the possibility. The first communication device transmits, to the second device, first information identifying that screening by the second device is required for the target; and the processor circuitry makes the second antenna start irradiation of the electromagnetic wave when the second communication device receives the first information.
Inventors:
Haruka Obata
Vermilion Asahi
Vermilion Asahi
Application Number:
JP2022140019A
Publication Date:
November 14, 2023
Filing Date:
September 02, 2022
Export Citation:
Assignee:
Toshiba Corporation
International Classes:
G01V3/12
Domestic Patent References:
| JP2017508949A | ||||
| JP2009222580A | ||||
| JP2017537399A |
Foreign References:
| US20140168013 |
Attorney, Agent or Firm:
Suzue International Patent Office
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