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Title:
SYSTEM, PROGRAM AND MARK SET FOR POSITION MEASUREMENT, AND OBJECT FOR POSITION MEASUREMENT
Document Type and Number:
Japanese Patent JP2010216969
Kind Code:
A
Abstract:

To provide a system, a program and a mark set for position measurement which maintain the accuracy of the position measurement of an object even when the mark set for the position measurement attached to the object faces a camera straight, and the object for position measurement.

The system for position measurement includes the mark set 2 which has four or more basic marks attached to the object 1 and being in the known positional relations, wherein at least one of the basic marks is disposed apart from a plane whereon the other three or more basic marks are positioned, and wherein the point of intersection with the plane of a perpendicular line drawn to this plane from the basic mark disposed apart from the plane is located outside a polygon formed by the other three or more basic marks. The system includes further the camera 13 which has a two-dimensional imaging element 12 imaging the mark set 2, and an arithmetic device 14 which computes at least one of a three-dimensional position and an angle of the object, based on an image of the mark set photographed by the camera 13.


Inventors:
SEKO YASUJI
HOTTA HIROYUKI
SAGUCHI YASUYUKI
Application Number:
JP2009063669A
Publication Date:
September 30, 2010
Filing Date:
March 16, 2009
Export Citation:
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Assignee:
FUJI XEROX CO LTD
International Classes:
G01B11/00; G01B11/26
Attorney, Agent or Firm:
Kiyoshi Tanaka
Murayama Midori