Temperature-compensated measurement probe to be accepted in the workpiece processing machine, and temperature compensation of the measurement probe - Bloom-Novotest Gezel Shaft Mitt Beschlenktel Haftung

Title:

Temperature-compensated measurement probe to be accepted in the workpiece processing machine, and temperature compensation of the measurement probe

Document Type and Number:

Japanese Patent JP6363349

Kind Code:

B2

Abstract:

The probe has a registering unit which registers measured values in respect of a workpiece and outputs signals representative of the measured values. The probing sensor converts probing operations into signals. The temperature sensor is connected with a measuring probe to generate a signal representative of the temperature of the measuring probe. A linking device links the signals of probing sensor with the signals of the temperature sensor to yield a temperature-compensated probing signal intended to be output to a numerical control system. An independent claim is included for method for compensating temperature of the measuring probe.

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Inventors:

Norbert mersch

Application Number:

JP2014013223A

Publication Date:

July 25, 2018

Filing Date:

January 28, 2014

Export Citation:

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Assignee:

Bloom-Novotest Gezel Shaft Mitt Beschlenktel Haftung

International Classes:

B23Q15/007; B23Q17/20

Domestic Patent References:

JP2002224935A
JP7108457A
JP2006145560A
JP61279465A
JP2009526985A

Foreign References:

US3250012
WO2000017602A1

Attorney, Agent or Firm:

Atsushi Aoki
Tetsuro Shimada
Shinji Mitsuhashi
Yasushi Ohashi
Kentaro Ito
Kazuo Maejima

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