Title:
TEMPERATURE SENSOR ABNORMALITY DETERMINATION DEVICE, TEMPERATURE SENSOR ABNORMALITY DETERMINATION METHOD, AND TEMPERATURE SENSOR ABNORMALITY DETERMINATION PROGRAM
Document Type and Number:
Japanese Patent JP2022148537
Kind Code:
A
Abstract:
To predict abnormality of two pairs of temperature sensors, using measurement values of the two pairs of temperature sensors.SOLUTION: A temperature sensor abnormality determination device 1, which determines abnormality of two pairs of temperature sensors A1 and A2 (B1 and B2) having two sensors measuring almost same place in an atmosphere of a measurement object integrated, comprises: a data accumulator 2 that accumulates measurement values of a plurality of latest samples every prescribed time of the two pairs of temperature sensors A1 and A2 (B1 and B2); a detector 3 that detects a differential of a difference between averages of measurement values of the two pairs of temperature sensors A1 and A2 (B1 and B2) accumulated in the data accumulator 2; and a sensor warning determinator 4 that determines presence or absence of abnormality of the two pairs of temperature sensors A1 and A2 (B1 and B2) on the basis of a detection result of the detector 3.SELECTED DRAWING: Figure 1
Inventors:
ISHIBASHI SEIZO
Application Number:
JP2021050264A
Publication Date:
October 06, 2022
Filing Date:
March 24, 2021
Export Citation:
Assignee:
CHINO CORP
International Classes:
G01K7/00; G01K1/14; G01K7/02
Attorney, Agent or Firm:
Nishimura Norimitsu
Noriyuki Suzuki
Noriyuki Suzuki
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