Title:
TERAHERTZ ELECTROMAGNETIC WAVE GENERATION METHOD AND SPECTROSCOPY/IMAGING MEASURING DEVICE
Document Type and Number:
Japanese Patent JP2008058918
Kind Code:
A
Abstract:
To provide a method of generating a terahertz electromagnetic wave by employing a compact optical system based on a single excitation laser whereas a conventional terahertz electromagnetic wave generation method employs a terahertz electromagnetic wave light source using nonlinear optical crystal, and to provide a measuring device.
When GaSe crystal having refractive index anisotropy is used as the nonlinear optical crystal, incident light is made incident almost in parallel to a refractive index principal axis to generate the terahertz electromagnetic wave. For the incident light, a high-output light source is used which has a wavelength of 650 nm.
Inventors:
NISHIZAWA JUNICHI
TANABE TADAO
KENMOCHI ATSUSHI
SASAKI TETSURO
KOYAMA YUTAKA
TANABE TADAO
KENMOCHI ATSUSHI
SASAKI TETSURO
KOYAMA YUTAKA
Application Number:
JP2006269435A
Publication Date:
March 13, 2008
Filing Date:
September 01, 2006
Export Citation:
Assignee:
SEMICONDUCTOR RES FOUND
International Classes:
G02F1/37
Domestic Patent References:
| JP2004101734A | 2004-04-02 | |||
| JP2006216799A | 2006-08-17 | |||
| JP2006091802A | 2006-04-06 | |||
| JP2006177716A | 2006-07-06 |
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