Title:
TEST APPARATUS FOR SIGNAL MAINTENANCE SYSTEM
Document Type and Number:
Japanese Patent JP3950006
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To attain high testing efficiency by downsizing and simplifying a test apparatus in additionally installing field apparatuses such as signal lights in a railroad station yard on a signal maintenance system which controls the field apparatuses with an electronic interlock device.
SOLUTION: This test apparatus includes an electronic terminal simulation apparatus 6 having simulation electronic terminals 61 to 6N for simulating respective electronic terminals in place of the plurality of electronic terminals, and produces a simulating condition for controlling the field apparatuses in response to a control instruction from the electronic interlock device 1 and simulate the plurality of electronic terminals with a small-sized and simple structure by making responds in the same way as for a case where the field apparatuses are connected.
Inventors:
Atsushi Mukai
Application Number:
JP2002131063A
Publication Date:
July 25, 2007
Filing Date:
May 07, 2002
Export Citation:
Assignee:
Mitsubishi Electric Corporation
International Classes:
B61L27/00; (IPC1-7): B61L27/00
Domestic Patent References:
| JP2000159107A | ||||
| JP6321101A | ||||
| JP2000225947A | ||||
| JP2001301619A |
Attorney, Agent or Firm:
Keigo Murakami
Masuo Oiwa
Toshihide Kodama
Takenaka Ikuo
Masuo Oiwa
Toshihide Kodama
Takenaka Ikuo