To provide a small-scale test circuit capable of efficiently detecting source line defects including short-circuited adjacent source lines and wrong connection, and to provide a display device having the same, a method of testing a display device, and the like.
A testing circuit 20, which is for testing a display device having a plurality of pixels arranged in a matrix and a plurality of source lines for inputting image signals to the respective plurality of pixels, includes; a comparator circuit 21 which receives the image signals on the plurality of source lines and outputs a result of comparison as a first signal Q; and a signal transfer circuit 23 which receives a test input signal and a signal produced from the first signal and outputs a result of a logical operation performed on the test input signal and the signal produced from the first signal as a test output signal.
Mitsue Obuchi
Misa Nagata