Title:
試験装置および有接点リレーの劣化判定方法
Document Type and Number:
Japanese Patent JP7437189
Kind Code:
B2
Abstract:
To provide a test device capable of predicting deterioration of a contact relay with high accuracy, and a deterioration determination method for the contact relay.SOLUTION: The present invention relates to a test device comprising: a plurality of contact relays 30; a voltage control section 10 which controls a voltage to be applied to the contact relay 30; a driving control section 10 which controls driving of the contact relay 30; a test processing section 10 which brings the contact relay 30 into an ON state and applies a predetermined test voltage to a test object, thereby determining electrical characteristics of the test object; and a deterioration determination section 10 which determines deterioration of the contact relay 30 on the basis of an operation time from starting the driving control for bringing the contact relay 30 into the ON state to bringing the contact relay 30 into the ON state or a recovery time from starting the driving control for bringing the contact relay 30 into an OFF state to bringing the contact relay 30 into the OFF state. The deterioration determination section 10 applies a voltage which is lower than the test voltage, as a deterioration determination voltage in determining the deterioration of the contact relay.SELECTED DRAWING: Figure 1
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Inventors:
Atsushi Nakai
Kenji Fukuda
Kenji Fukuda
Application Number:
JP2020033175A
Publication Date:
February 22, 2024
Filing Date:
February 28, 2020
Export Citation:
Assignee:
Shikoku Measurement Industry Co., Ltd.
International Classes:
H01H47/00
Domestic Patent References:
| JP2010230675A | ||||
| JP2011210546A |
Attorney, Agent or Firm:
Akinobu Sudo
Asako Sudo
Asako Sudo